Ambient Scanning Probe Microscopes                                                       

      The SPM facilities equipped with the state-of-the art Scanning Tunelling Microscopes (STM) and Multimode Scanning Force Microscopy (SFM), including Atomic Force Microscopy (AFM), Electrostatic Force Microscopy (EFM), Friction Force Microscopy (FFM), Magnetic Force Microscopy (MFM) and Conducting Atomic Force Microscopy (CAFM) and Near Field Optical Microscopy (NSOM).   These microscopies have the capability of imaging in real space localized surface features with extremely high lateral and vertical resolution.  The resolution can reach the nanometer scale. These techniques are applied to characterize the epitaxial growth, transport properties, magnetic properties and ion beam modification of semiconductors as well as for nanofabrication.